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List Equipment

Equipment/Machine

Service

Location

Cost

Availability Status

  • Field Emission Scanning Electron Microscope

    • Cairo , Egypt.

    Leo Supra 55, Ultra high resolution at low kV: 1 nm @ 15 kV, 1.7 nm @ 1 kV, 4 nm @ 0.1 kV Magnification: 20x to 900,000x Electron gun: thermal field emission type High efficiency in-lens detector Wide operating voltage range: 0.1 kV to 30 kV Ultra stable high current mode for X-ray analysis and EBSD applications 20 nA/0.2%/h. EBSD, EDS

    Service/Test: Field Emission Scanning Electron Microscope

  • High temperature muffle furnace

    • Kafr Elshiekh , Egypt.

    Nabertherm GmbH

    Service/Test: High temperature muffle furnace

  • Vacuum furnace

    • Auckland , New Zealand.

    Max 1800 °C

    Service/Test: Vacuum furnace

  • Point load tester

    • Seoul , South Korea.

    material strength determination for FIG

    Service/Test: Point load tester

  • Scanning electron microscope (SEM)

    • Khomas , Namibia.

    Material structural characterization

    Service/Test: Scanning electron microscope (SEM)

  • Sand Blaster

    • Johannesburg , South Africa.

    Material Surface cleaning

    Service/Test: Sand Blaster

  • High Pressure Oxygen Tube Furnace

    • Seoul , South Korea.

    OTF-1200X-HP-55. Tube-type furnace capable of pre-treating materials and samples in O2 or inert gas (N2 or He) atmosphere under high-temperature and high-pressure. Max. 30MPa 800℃ Max. 18MPa 900℃ Max. 9MPa 1,000℃ Max. 6MPa 1,100℃

    Service/Test: High Pressure Oxygen Tube Furnace

  • Advance Diffractometer (XRD)

    • Melbourne , Australia.

    Bruker D8

    Service/Test: Advance Diffractometer (XRD)

  • Scanning Electron Microscope

    • Melbourne , Australia.

    FlexSEM 1000

    Service/Test: Scanning Electron Microscope

  • Proto iXRD Residual Stress

    • Melbourne , Australia.

    Materials characterisation

    Service/Test: Proto iXRD Residual Stress

  • X-Ray Diffraction

    • Seoul , South Korea.

    Technique used to determine the atomic and molecular structure of materials

    Service/Test: X-Ray Diffraction

  • Atomic Force Microscope (AFM)

    • Adelaide , Australia.

    NT-MDT Ntegra Solaris (AFM + SNOM)

    Service/Test: Atomic Force Microscope (AFM)

  • Electronic Densimeter

    • Ontario , Canada.

    measurable weight of 0.01-300g and a density resolution of 0.001g/cm3

    Service/Test: Electronic Densimeter

  • NanoDrop® ND-8000

    • Ontario , Canada.

    designed for the use of 1 ul samples

    Service/Test: NanoDrop® ND-8000

  • Atomic Absorption Measurements

    • Mansoura , Egypt.

    AA240FS

    Service/Test: Atomic Absorption Measurements

  • Keithly US (measurement instrument)

    • Seoul , South Korea.

    4200-SCS. DC CURRENT-VOLTAGE: 10 aA - 1A (I-V) RANGE: 0.2 µV - 210 V. CAPACITANCE-VOLTAGE: 1 kHz - 10 MHz (C-V) RANGE: ± 30V DC bias. PULSED I-V: ±40 V (80 V p-p), ±800 mA RANGE: 200 MSa/sec, 5 ns sampling rate

    Service/Test: Keithly US (measurement instrument)

  • Spectrophotometer

    • Cairo , Egypt.

    Measurement of amount of light absorbed by a material

    Service/Test: Spectrophotometer

  • Activelife Technologies Biodent 1000

    • Auckland , New Zealand.

    Measurement of bone and tissue qualityat clinical level

    Service/Test: Activelife Technologies Biodent 1000

  • Ionic Chromatography System (ICS)

    • Mansoura , Egypt.

    ICS-1000FS

    Service/Test: Ionic Chromatography System (ICS)

  • Total Organic Carbon & Total Nitrogen Analyzer

    • Mansoura , Egypt.

    HT1300

    Service/Test: Total Organic Carbon & Total Nitrogen Analyzer