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Mass Balance
- Johannesburg , South Africa.
Mass Balance
Service/Test: Mass Balance
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Gas Chromatography/Mass Spectrometry
- Khomas , Namibia.
Material analysis
Service/Test: Gas Chromatography/Mass Spectrometry
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Raman Spectrometers
- Auckland , New Zealand.
Multiple laser excitations, time -resolved (ms) and scanning/mapping capabilities
Service/Test: Raman Spectrometers
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Low and high field NMR facility
- Auckland , New Zealand.
Material characterisation using NMR spectroscopy, diffusometry and imaging
Service/Test: Low and high field NMR facility
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Transmission Electron Microscope
- Kafr Elshiekh , Egypt.
200 kV TEM/FEG TEM (JEM-2100)
Service/Test: Transmission Electron Microscope
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X-Ray Diffraction
- Seoul , South Korea.
D8 Advance(2020.multi-purpose XRD)
Service/Test: X-Ray Diffraction
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Atomic Force Microscope
- Mansoura , Egypt.
Flex AFM C3000
Service/Test: Atomic Force Microscope
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Scanning electron microscope (SEM)
- Canterbury , New Zealand.
JEOL JSM 7000F Field emission, high resolution SEM. JEOL energy dispersive x-ray analysis system. Backscatter electron detector. Infrared chamber camera. Gatan Cathodoluminescence detector
Service/Test: Scanning electron microscope (SEM)
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Scanning electron microscope (SEM)
- Canterbury , New Zealand.
JEOL JSM IT-300, variable pressure. Oxford Aztec SDD energy dispersive x-ray analysis system, Aztec/HKL Electron Backscattered Detector (EBSD) system, Aztec Large area mapping and feature software, Forescatter and backscatter electron detectors
Service/Test: Scanning electron microscope (SEM)
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Scanning Electron Microscopy
- Queensland , Australia.
JOEL JSM 6510
Service/Test: Scanning Electron Microscopy
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Scanning Electron Microscope
- Seoul , South Korea.
JSM-6360
Service/Test: Scanning Electron Microscope
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Scanning Electron Microscope
- Seoul , South Korea.
MERLIN Compact (FE-SEM), Zeiss
Service/Test: Scanning Electron Microscope
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Scanning Electron Microscope
- Kafr Elshiekh , Egypt.
SEM IT100 - JEOL- JAPAN
Service/Test: Scanning Electron Microscope
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X-Ray Diffraction
- Kafr Elshiekh , Egypt.
Shimadzu 6000
Service/Test: X-Ray Diffraction
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Scanning Electron Microscope
- Waikato , New Zealand.
with Energy dispersive X-ray Analyser (EDX)
Service/Test: Scanning Electron Microscope
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Transmission Electron Microscope (TEM)
- Canterbury , New Zealand.
Philips CM120 TEM. Single and double tilt holders.
Service/Test: Transmission Electron Microscope (TEM)
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Transmission Electron Microscope (TEM)
- Canterbury , New Zealand.
Philips CM200 High resolution Analytical TEM. Single and double tilt holders, Oxford INCA energy dispersive x-ray analysis system, Gatan digital camera
Service/Test: Transmission Electron Microscope (TEM)
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X-Ray Diffraction
- Seoul , South Korea.
Technique used to determine the atomic and molecular structure of materials
Service/Test: X-Ray Diffraction
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Field Emission-Scanning Electron Microscope (FE-SEM)
- Seoul , South Korea.
Material characterization: topography, elemental information
Service/Test: Field Emission-Scanning Electron Microscope (FE-SEM)
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SEM
- Johannesburg , South Africa.
material characterization; microstructure, mapping
Service/Test: SEM
