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Vacuum Conc. CENTRIF./PUMP
- Kafr Elshiekh , Egypt.
UNIVAPO100ECH
Service/Test: Vacuum Conc. CENTRIF./PUMP
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Hydraulic Presses
- Cairo , Egypt.
Up to 100 Ton
Service/Test: Hydraulic Presses
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Tube furnaces
- Randburg , South Africa.
Up to 1800°C
Service/Test: Tube furnaces
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CD micro-spectrometer
- Auckland , New Zealand.
UV-near-IR. Alternating circular polarisation, High-NA microscope objectives. Spectrometer with CCD and PMT detectors for absorbance, fluorescence, Raman measurements of optical activity
Service/Test: CD micro-spectrometer
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Atomic Force Microscope
- Cairo , Egypt.
Vecco
Service/Test: Atomic Force Microscope
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Dynamica Refridged Centrifugation
- Queensland , Australia.
Velocity 10R, capacity up to 3 litres, SW3A rotor, speed of 10,000 RPM (12,740 x g with the FA10D rotor)
Service/Test: Dynamica Refridged Centrifugation
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Visulaization
- Johannesburg , South Africa.
Vesta, Xcrysden
Service/Test: Visulaization
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VisualSonics Ultrasound
- Sydney , Australia.
Vevo2100 + VevoLAZR, Vevo3100
Service/Test: VisualSonics Ultrasound
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SP Industries, INC.VIR TIS BECHTOP FREEZE DRYERS
- Queensland , Australia.
VirTis BenchTop 2K, 4K and 6K freeze dryers, temperature range of -55 °C to -105 °C
Service/Test: SP Industries, INC.VIR TIS BECHTOP FREEZE DRYERS
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Mass Spectrometer
- Melbourne , Australia.
Waters Vion IMS QTOF
Service/Test: Mass Spectrometer
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X-Ray spectroscopy
- Sydney , Australia.
X-Ray fluorescence
Service/Test: X-Ray spectroscopy
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X-Ray spectroscopy
- Sydney , Australia.
X-Ray or ultraviolet photoelectron , (XPS/UPS)
Service/Test: X-Ray spectroscopy
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NanoFab Advanced Scanning ion Microscope
- Melbourne , Australia.
Zeiss ORION
Service/Test: NanoFab Advanced Scanning ion Microscope
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Gas Chromatography Mass Spectrometer (Agilent 7890A/5975C GCMS System)
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
Special Features • High temperature, solid inert ion source boost productivity • Gold standard quadrupole design and performance • Triple-Axis Detector • Trace Ion Detection and the second generation of Deconvolution Reporting Software (DRS) delivers a real performance improvement for trace analysis in complex matrices • High-Performance Selected Ion Monitoring (SIM) and Full Scan • Synchronous SIM/Scan functionality captures SIM data and full scan data in the same acquisition, with no compromise in analytical performance. • SIM dwell times can be set in from over 100 msec to 1 msec in 1 msec increments. AutoSIM automatically converts scan data into SIM or SIM/scan acquisition parameters saving setup time for methods with many peaks. GC/MS software helps you make the most of every run, and every workday • Control of two GC/MS systems from a single MSD ChemStation • Integrated control of the versatile CTC PAL autosamplers can boost your lab s output with automated sample preparation (available option). • Retention Time Locking (RTL) gives you repeatable retention times across systems regardless of operator, detector type and column maintenance. In combination with Agilent or user-created databases, it will let you quickly screen unknown peaks with added confidence. • Automatic tuning to ensure more accurate results every time for EI, PCI and NCI Modes. • SemiQuant capability to estimate the concentration of uncalibrated compounds. • Integration with Enterprise Content Management (ECM) makes it easy to store, retrieve and organize all of the electronic data generated in your laboratory including your GC/MSD files and reports. Maintenance and Reliability Features • High-reliability vacuum system assures maximum long-term performance; available oil-free pumping systems virtually eliminate pump maintenance, reduce noise, and can be used with corrosive gases such as ammonia.
Service/Test: Gas Chromatography Mass Spectrometer
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Universal Testing Machine Electro-Mechanical 50kN
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
50kN load cell with Class 0.5 accuracy for load range from 1% to 100% of 50kN. Load measurement traceable to NVLAP and meets ASTM E4 & ISO 7500-1 standards (verified/ calibrated by Instron).
Service/Test: Universal Testing Machine Electro-Mechanical 50kN
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Zeiss LSM 700 MAT With Axio Imager.Z2 Vario Confocal Laser Microscope
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
Zeiss unique contrast scanning module system which utilize the advanced (calibrated and linearized) Laser PMT detection with stronger solid-state laser line 405nm class 3b and color CCD camera for 3D image overlay with better laser beam penetration than class 2 laser system. Dimension of the stage is 520mm x 400mm with the motorized stage movement of up to 300mm x 300mm. In addition, vacuum wafer holder for 12” wafer are included. Zeiss unique Circular DIC is capable of Pseudo 3D in 360° in lateral direction which the images can be overlayed on the quantitative 3D laser confocal image.CDIC provides pseudo 3D for surface morphology or height in excellent contrast, which DIC could not achieve. It provide excellent illumination of different rotation angle in the lateral plane, e.g. if the scratches or morphology is oriented in certain degree, user do no need to rotate the sample but only rotating the CDIC knurl knob. 3D topographical studies and analysis are included. Roughness measurement is in accordance to the compliance with ISO25178, EUR 15178N, ASME B46.1.
Service/Test: Zeiss LSM 700 MAT With Axio Imager.Z2 Vario Confocal Laser Microscope
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Extreme High Resolution Field Emission Scanning Electron Microscope (XHR-FESEM) Model FEI Verios 460L
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
Electron beam resolution: Resolution @ optimum WD • 0.6 nm at 30 kV (STEM *) • 0.7 nm at 15 kV • 0.7 nm at 1 kV • nm at 500 V (ICD **) • 1.2 nm at 200 V (ICD **) Landing energy range • 20 eV - 30 keV Probe current • E-beam: 0.8 pA up to 100 nA Detectors • In-lens SE detector (TLD-SE) • In-lens BSE detector (TLD-BSE) • In-column SE detector (ICD) ** • In-column BSE detector (MD) ** • Everhart-Thornley SE detector (ETD) • IR camera for viewing sample/column • Chamber mounted Navigation Camera • Retractable low voltage, high contrast solid-state backscatter electron detector (DBS) • Retractable STEM detector with BF/DF/ HAADF segments • Oxford Silicon Drift Detector (SDD) - X-Max EDS/EDX detector Sample sizes • Maximum size: 100 mm diameter with full rotation • Maximum sample thickness (via loadlock): 19 mm incl. stub • Maximum sample thickness (via chamber door): 19 mm incl. stub • Weight: 200 g (incl. holder) Sample holders • Multi-stub holder (5 stubs) • Multi-sample cross-sectional holder • Single stub mount, mounts directly onto stage • Various wafer and custom holder(s) available by request
Service/Test: Extreme High Resolution Field Emission Scanning Electron Microscope (XHR-FESEM) Model FEI Verios 460L
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High Resolution Transmission Electron Microscope (HRTEM) 200kV With Field Emission, TECNAI G2 20 S-TWIN, FEI
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
- STEM, HR-STEM, Z-contrast - TEM, HR-TEM - Oil-free vacuum system - Fully integrated motorized apertures - Low background double tilt holder for EDX on zone axis (Si<110>) - S2-93 compliant - Remote operation - E xcellent stability of focus, high tension, - energy spread, spot, alignment and specimen stage - Complete and fast recall of all modes and accelerating voltage settings - Full digital control of STEM/TEM and accessories - Easy and secure operation in a multiuser environment - The “All in One” Tecnai Next generation G2 - EDX - Plasma Cleaning System
Service/Test: High Resolution Transmission Electron Microscope (HRTEM) 200kV With Field Emission, TECNAI G2 20 S-TWIN, FEI
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High Resolution Multi Technique X-Ray Spectrometer (Axis Ultra DLD XPS, Kratos)
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
• Multi technique surface analysis including XPS, SAM, ISS, and UPS • Qualitative and quantitative analysis and composition • Chemical state analysis and quantification • Minimum spot size analysis of 15 um. • Real time parallel quantitative chemical imaging at resolution of 3 micron. • Angle resolved spectroscopy for film thickness measurement.
Service/Test: High Resolution Multi Technique X-Ray Spectrometer (Axis Ultra DLD XPS, Kratos)
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Fourier Transform Infrared – Imaging (Perkin Elmer Spotlight 400 FT-IR & FT-NIR Imaging System)
- Science & Engineering Research Centre(SERC) Engineering Campus,Universiti Sains Malaysia 14300 Nibong Tebal,Seberang Perai Selatan Pulau Pinang,MALAYSIA , Nibong Tebal , Malaysia.
• LIFE TIME warranty Dynascan Interferometer. • Proprietary Atmosphere Vapor Correction (AVC) for full moisture and CO2 subtraction. • Patented Hot Spot Stabilization laser source and Absolute Virtual Instrument (AVI) intellectual property to ensure IR spectra reproducibility. • Collect 170 high-quality spectra per second.
Service/Test: Fourier Transform Infrared – Imaging (Perkin Elmer Spotlight 400 FT-IR & FT-NIR Imaging System)
