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Ultrasonic cleaning
- Johannesburg , South Africa.
Sample cleaning
Service/Test: Ultrasonic cleaning
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Ultrasonic bath
- Johannesburg , South Africa.
Sample cleaning
Service/Test: Ultrasonic bath
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Precision Sectioning Saw
- Seoul , South Korea.
IsoMet 1000
Service/Test: Precision Sectioning Saw
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Drying furnace
- Seoul , South Korea.
sample drier
Service/Test: Drying furnace
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Flurometer
- Seoul , South Korea.
Sample fluorescence measurement
Service/Test: Flurometer
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Tube Furnace
- Johannesburg , South Africa.
Lenton TSH 12/38/250 Tube Furnace
Service/Test: Tube Furnace
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TEM Sample preparation equipment
- Auckland , New Zealand.
carbon evaporator unit (Edwards)
Service/Test: TEM Sample preparation equipment
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TEM Sample preparation equipment
- Auckland , New Zealand.
ion mill (Fischione)
Service/Test: TEM Sample preparation equipment
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TEM Sample preparation equipment
- Auckland , New Zealand.
plasma cleaner (Fischione)
Service/Test: TEM Sample preparation equipment
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TEM Sample preparation equipment
- Auckland , New Zealand.
sample vitrifier (FEI Vitrobot) for cryo-TEM
Service/Test: TEM Sample preparation equipment
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TEM Sample preparation equipment
- Auckland , New Zealand.
ultrasonic disc cutter (Fischione)
Service/Test: TEM Sample preparation equipment
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Cutting Machine
- Johannesburg , South Africa.
Sample preparation
Service/Test: Cutting Machine
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12T Laboratory Press
- Seoul , South Korea.
EQ-YLJ-12T. Max Pressure: 12MPa (Pressure gauge is built in). Max Lifting Height of Bottom Cylinder: 25mm. Top Support Screw Adjustable Height: 150mm
Service/Test: 12T Laboratory Press
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Grinding and Polishing machine
- Nairobi , Kenya.
sample preparation for metallographic analysis
Service/Test: Grinding and Polishing machine
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Sample Polishing machine
- Randburg , South Africa.
Sample preparation for metallography (grinding, polishing, etching)
Service/Test: Sample Polishing machine
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Field Emission-Scanning Electron Microscope (FE-SEM)
- Seoul , South Korea.
Equipped with EDX, SE, BSE, STEM. Characterization techniques which provides information on the surface morphologies such as shapes and sizes of carbon nanostructures
Service/Test: Field Emission-Scanning Electron Microscope (FE-SEM)
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Atomic Force Microscope
- Seoul , South Korea.
NX10 AFM. Single module flexure XY-scanner with closed-loop control 50 µm × 50 µm (optional 10 µm × 10 µm or 100 µm × 100 µm) Resolution: 0.05 nm Position detector noise: < 0.25 nm (bandwidth: 1 kHz) Out-of-plane motion: < 2 nm (over 40 µm scan) . Sample size: up to 50 mm x 50 mm, up to 20 mm thickness Sample weight: up to 500 g XY stage travel: 20 mm x 20 mm Z travel: 25 mm Focus travel: 15 mm . Guided high-force flexure scanner Scan range: 15 µm (optional 30 µm) Resolution: 0.015 nm Position detector noise: 0.03 nm (bandwidth: 1 kHz) Resonant frequency: > 9 kHz (typically 10.5 kHz). Atomic-scale resolution depending on the diameter of the tip (nm). Sample analysis without pretreatment (except for liquid samples)
Service/Test: Atomic Force Microscope
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Electrophoresis
- Instabul , Turkey.
Horizontal Electrophoresis
Service/Test: Electrophoresis
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Tribo-Indenter
- Sydney , Australia.
Hysitron Inc. SPM and AFM imaging of indentations. Load range: 10µN to 30mN, max displacement: 5 microns
Service/Test: Tribo-Indenter
